Automated Test Archives

Microfabrication silicium LabVIEW détection semiconducteurs

Vincent Carpentier
March 26, 2018

Datalogger and analysis system for a wafer fabrication process

Le but de ce projet est de réaliser un système de détection de dépassement de seuil en temps réel permettant de calculer la durée de chaque..

TestStand Edit steps J1939 sequence step types

Vincent Carpentier
November 28, 2017

Validate CAN (J1939) interface on multiple UUTs with NI TestStand and NI LabVIEW

By using LabVIEW and TestStand, we were able to build a generic librairy that would enable to read/write CAN message based on the SAE J1939 standard..

Vincent Carpentier
June 1, 2017

Automated Fine Guidance Sensor alignment system

The goal was to automate the alignment of the Fine Guidance Sensor of a telescope. The final system aligned several telescopes mounted in an aluminum structure..

Automated Test

Automated Test (3)

Datalogger and analysis system for a wafer fabrication process

Validate CAN (J1939) interface on multiple UUTs with NI TestStand and NI LabVIEW

Automated Fine Guidance Sensor alignment system

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